Rohde & Schwarz will host the second edition of its virtual RF Testing Innovations Forum on May 20, 2026, bringing together engineers and specialists to share practical solutions for some of today’s most demanding RF testing challenges. As satellite communications and defense systems continue to grow, RF testing is becoming more critical and more complex than ever.
The forum will feature presentations from experts at Rohde & Schwarz, Dassault Systèmes, FormFactor and Focus Microwaves, covering topics such as residual measurements for active device characterization and absolute phase validation across different frequencies.
Markus Loerner, Market Segment Manager RF & Microwave Components at Rohde & Schwarz, will open the event with a keynote titled “The commercialization of specialized aerospace and defense components.” He will look at how the expansion of satellite communications and defense applications is increasing demand for more RF systems and specialized components, while also discussing how to simplify test requirements and speed up time-to-market.
Another session during the RF Testing Innovations Forum will focus on the importance of absolute phase measurements across a wide frequency range. It will explain different phase calibration approaches, including comb generators and traceability, and examine case studies covering time-domain transformations, frequency-converter validation and instrument-specific considerations for VNAs.
The forum will also explore sub-THz on-wafer testing methods and best practices. As multi-gigabit digital communication systems move to higher frequencies, test engineers need to push the limits of on-wafer S-parameter measurements to accurately model and characterize devices.
A live demonstration from the FormFactor labs in Dresden, Germany, will show best practices for achieving accurate, stable and repeatable D-band on-wafer S-parameter measurements using an R&S ZNA with 170 GHz frequency extenders.
RF Testing Innovations Forum will conclude with a session on noise validation in RF circuits up to 67 GHz. With performance demands rising for low-noise amplifiers in applications such as LEO satellite communications, remote sensing and quantum computing, accurate noise measurements are becoming increasingly important.
Since the LNA is usually the first stage in a receiver, its noise behavior has a major impact on overall system noise figure and sensitivity.
The session will cover the fundamentals of noise measurement and noise parameter extraction using the cold-source method, with measurements carried out on the latest R&S ZNA vector network analyzer with noise figure testing capabilities.
The conference is free to attend, though registration is required.
To KNow More About The Full Agenda, Speaker Biographies And The Registration Portal: CLICK HERE
