Rohde & Schwarz will demonstrate its most recent solutions and innovative techniques for testing and evaluating power electronic systems and components at PCIM Expo 2025 in Nuremberg, Germany. The company’s display (hall 7, booth 166) will focus on solutions that use the company’s cutting-edge test instruments to handle the issues of debugging next-generation wide bandgap semiconductors such as GaN and SiC.
Rigorous testing and advanced characterization methodologies assist design engineers in improving the performance, efficiency, and reliability of their power electronic designs based on SiC and GaN devices, which are employed in cutting-edge industries such as e-mobility, renewable energy, and AI data centers.
Rohde & Schwarz will showcase a selection of its extensive T&M range to booth 166 in hall 7 of PCIM Expo 2025, taking place from May 6 to 8 at the Nuremberg Exhibition Center. The test solutions are designed for power electronics applications that require high efficiency, quick switching speeds, increased power density, and operation at high temperatures.
Wide Bandgap Analysis
The R&S RT-ZISO isolated probing system from Rohde & Schwarz will be central to the presented setups. This next-generation isolated probe has redefined accuracy, sensitivity, dynamic range, and bandwidth for wide bandgap (WBG) power systems using SiC and GaN.
Rohde & Schwarz will demonstrate the advantage of the R&S RT-ZISO over single-ended probes in a setup designed to explore the switching behavior of a GaN-MosFET.
Double Pulse Testing
Double pulse testing is a technique for determining the switching performance of SiC and GaN-based power devices.
Rohde & Schwarz is partnering with industry specialist PE-Systems GmbH to develop a robust and accurate solution to double pulse testing using Rohde & Schwarz’s MXO 5 next generation oscilloscope with eight channels and the R&S RT-ZISO.
Visitors to PCIM can enjoy accurate, reliable, and rapid double pulse testing on Wolfspeed 1200 V SiC devices, which are commonly used as traction inverters in the automobile sector.
Automated loadjump testing
Loadjump testing used to be a time-consuming manual technique for verifying a Buck converter’s load step response at several input voltage levels using only a few reference points. Rohde & Schwarz also collaborates with PE-Systems GmbH on this application, which provides test automation software.
This solution, when combined with the MXO 5 oscilloscope and the R&S RT-ZISO isolated probing system, not only saves total testing time but also keeps the number of test points constant. At PCIM, the businesses exhibit automated loadjump testing of a Monolithic Power Systems, Inc. Buck converter with a voltage range of 6V to 60V.
The setup even supports multiple reference points within the same timeframe and can be expanded to include temperature control, allowing for complete automation of input voltage, load current, and temperature profile fluctuations.
Component characterization
Rohde & Schwarz will also provide solutions for component characterization. The R&S LCX LCR meters, which include configurable impedance measuring features, are suited for all discrete passive components up to 10 MHz.
The R&S LCX allows users to readily characterize the voltage dependency of capacitances in key components of power converters such as MLCCs. When combined with a sweep software tool, users can take detailed sweep measurements and present them in a variety of charts.
The MFIA impedance analyzer from Zurich Instruments AG (a subsidiary since 2021) can perform impedance spectroscopy on both low impedance components like shunt resistors and DC-link capacitors and high impedance systems.
It includes measurement modes for impedance study over frequency and time, as well as features like an integrated oscilloscope and spectrum analyzer.
Leadership Comments
Dr. Philipp Weigell, Vice President of the Industry, Components, Research & University Market Segment at Rohde & Schwarz, explains: “PCIM Expo is an important venue for us to highlight our advancements in wide bandgap semiconductor testing. Testing plays a critical role to improve power efficiency, reduce size, and manage heat more effectively in power conversion applications used in AI data centers, for instance. Through collaboration with industry experts and with our advanced testing solutions we enable our customers to develop reliable and efficient systems that meet the rigorous demands of modern data processing applications.”
Rohde & Schwarz will present these and other advanced test solutions at PCIM Expo 2025, from May 6 to 8, at booth 166, hall 7 of Nuremberg Exhibition Center. For more information on power electronics test solutions from Rohde & Schwarz, visit: https://www.rohde-schwarz.com/power-electronics
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