Rohde & Schwarz is hosting a free online Power Electronics Conference titled “From Design to Validation” on May 5 and 6, 2026. The event brings together experts from both industry and academia to focus on reliable measurement and validation techniques for modern power electronic systems covering everything from discrete components to grid-connected converters.
The power electronics market is under pressure from tighter efficiency targets, higher power densities, and deeper integration with large-scale power grids. As a result, engineers are dealing with increasingly tricky issues like non-ideal component behavior, fast transient stresses on wide-bandgap devices like SiC and GaN, and ever-stricter EMC requirements.
The free online Power Electronics Conference will focus on these challenges head-on with measurement-centric solutions that can be implemented using modern oscilloscopes, vector network analyzers, and precision power analyzers.
The program kicks off on May 5 with a keynote by Tobias Keller (Hitachi Energy) titled “Power Semiconductors: Shaping the Future Power Grid – Performance and Reliability for Future Decades.” Keller will walk through how silicon and silicon carbide (SiC) devices are qualified for high-voltage grid applications, focusing on thermal cycling, short-circuit robustness, and long?term reliability data.
On May 6, a second keynote by Veit Hellwig (Infineon Technologies) will explore how gallium-nitride (GaN) technology is reshaping high-voltage motor inverter topologies.
Beyond the keynotes, the conference features a series of technical sessions. One session dives into passive component characterization, showing how to extract parasitic inductance and capacitance at frequencies above 100 MHz and how these non-idealities can affect converter stability.
Another session covers automated dynamic characterization of SiC and GaN power devices, demonstrating how double-pulse test rigs can be synchronized with high-speed digitizers to reduce measurement uncertainty and capture fast recovery behavior.
Electromagnetic compatibility gets dedicated coverage in two talks. The first offers practical guidance on using near-field probes to trace radiated emission sources and to validate the effectiveness of EMI filter designs.
The second walks through a complete conducted emission measurement workflow on a small-scale prototype, using a Line Impedance Stabilization Network (LISN) alongside a modern mixed-signal oscilloscope, and then outlines a filter design methodology that takes full advantage of the instrument’s time-frequency capabilities.
A separate webinar focuses on the growing need for accurate efficiency measurements in data center and AI server power supplies. By using precision power analyzers capable of tracking distorted waveforms and rapid load transients, attendees will learn how to extract true input and output power values that meet 80 PLUS certification requirements.
The final session zooms in on harmonic current and voltage flicker compliance for low-voltage, grid-connected products.
The speaker will review the limits and test procedures specified in standards such as IEC/EN 61000-3-2 / 61000-3-3 and IEC/EN 61000-3-12 / 61000-3-11, and demonstrate how integrated compliance-testing software, paired with a power analyzer, can deliver automated pass/fail decisions, from early prototype evaluation all the way through to final type approval.
Speakers include subject-matter experts from Rohde & Schwarz, Hitachi Energy, Infineon Technologies, PE-Systems, Würth Elektronik, and the Universities of Bremen and Zaragoza. Their contributions mix academic insight with real-world experience, giving attendees both solid theoretical background and practical measurement strategies they can apply in the lab.
The conference is free to attend, but registration is required.
To Know More About The Full Agenda, Speaker Biographies And The Registration Portal: CLICK HERE
