A High Voltage Wafer Test System for power semiconductors operating up to 3kV has been developed by Keysight Technologies. Manufacturers of power semiconductors can increase production thanks to the Keysight 4881HV, which allows parametric tests up to 3kV, supporting both high and low voltage in a single run.
Power device manufacturers can now conduct process control monitoring (PCM) and wafer acceptance testing (WAT) in manufacturing with a high-voltage switching matrix (HV-SWM) thanks to the Keysight 4881HV High Voltage Wafer Test System.
It is scalable up to 29 pins, supports up to 3kV requirements, and integrates with precision source measure units (SMUs). This allows for extremely versatile measurements at any pin, ranging from low current to sub-pA resolution up to 3kV.
Furthermore, several parametric tests and high-voltage capacitance measurement are supported.
No Need For Using Separate High- And Low-Voltage Testers
Wafers have typically been measured by manufacturers using separate high- and low-voltage testers. However, because of their increased performance, versatility, and next-generation technologies like silicon carbide (SiC) and gallium nitride (GaN), the market for power semiconductors is expanding quickly.
Rather than having separate high-voltage and low-voltage test systems, the HV-SWM allows for the use of a single test system. It is more effective to use a single system since it requires less space and requires less testing time. The SPECS-FA software from Keysight is used to link the system with factory automation environments, increasing the productivity of the entire production process.
The test system complies with safety rules, including SEMI S2 standards, and has built-in protection circuitry and machine control to ensure that personnel and equipment are not harmed by high-voltage surges during a test.
Key Comments
“Keysight is thrilled to introduce our new wafer test system for power semiconductors, building on our long tenure of testing advanced semiconductors. Our mission is to lead the market by providing cutting-edge solutions that anticipate and meet the rapidly evolving needs of the semiconductor sector. This latest innovation exemplifies our unwavering commitment to the industry,” said Shinji Terasawa, Vice President and General Manager of Keysight’s Wafer Test Solutions.
Further Info on the Keysight 4881HV High Voltage Wafer Test System, CLICK HERE
