The T2000 AiR2X, a next-generation air-cooled test system designed to address the growing need for compact and cost-effective testers in evaluation and high-mix, low-volume production environments, was unveiled by Advantest Corporation.
The new approach maintains low power and air-cooled requirements while providing double the test resources of the prior air-cooled T2000 AiR test system and is completely compatible with the conventional T2000 test system.
The T2000 AiR2X addresses a number of converging market factors, such as ongoing replacement needs for compact air-cooled testers and end-of-life support for legacy systems like the T6500 and T7700 series.
With numerous air-cooled SoC test systems in use across the globe, Advantest is well-positioned to meet ongoing demand in this expanding market due to the new T2000 AiR2X solution.
The T2000 AiR2X offers up to 12 measurement modules, including functional/SCAN test, high-precision DC, and automotive device DC testing up to 320V, because to its flexible measurement configuration. During volume manufacturing, the system’s special multisite controller feature drastically cuts down on test time.
The T2000 AiR2X uses the same program environment as the T2000 and integrates Advantest’s T2000 RECT550 performance board, which adaptably supports a variety of configurations, a single support infrastructure, and extendable module options.
Additionally, the Rapid Development Kit (RDK) contributes to faster platform migration and implementation timeframes by drastically reducing the work needed for program design and debugging.
The T2000 AiR2X has a wide range of applications, including industrial MCUs, consumer ASICs, battery-monitoring ICs for mobile and automotive devices, and power analog applications, according to preliminary device evaluations. Later this month, the system will go into wide availability.
Leadership Comments
“Our compact, air-cooled T2000 AiR2X and high-density, high-pin-count V93000 create a unified test solution that covers the full spectrum of SoCs—from air-cooled segments to large-scale, digitally rich devices,” said Toshiaki Adachi, leader, T2000 Product Unit, Advantest. “The T2000 boosts deployment efficiency, eases migration from aging testers, and doubles resource capacity per floor area, while the V93000 delivers the performance required for advanced, large-scale SoCs. Together, this complementary pair reduces SoC deployment costs and environmental impact, from evaluation through to mass production, providing comprehensive solutions to empower customer innovation.”
To learn more about the new T2000 AiR2X and Advantest’s broad portfolio of test solutions, visit the company at SEMICON Japan, Booth E4346, Tokyo Big Sight, December 17-19, 2025.
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