With its wide range of innovative test solutions, Rohde & Schwarz equips design engineers to take on the new challenges in all embedded systems, from digital design and connectivity to energy efficiency and electromagnetic interference.
Embedded systems are the foundation of contemporary electronic devices, encompassing power input stages, main control PCBs, motors, motor controls, sensors, and user interfaces. Each functional block needs thorough testing to guarantee optimal performance, reliability, and a quick market release of the finished product.
At the embedded world exhibition and conference in Nuremberg, Germany, Rohde & Schwarz will showcase its next-gen test and measurement solutions for the embedded sector. From March 11 to 13, 2025, visitors can locate the T&M specialist at booth 4-218 in hall 4 of the Nuremberg Exhibition Center.
Visitors have the chance to interact with the company’s experts and learn about the newest technologies that are intended to improve device energy efficiency, accelerate EMC compliance during the design phase, expedite the debugging of digital protocols, and satisfy regulatory requirements for wireless interfaces.
Ensuring energy efficiency and reliability in power electronics
Rohde & Schwarz will demonstrate its expanding line of next-generation oscilloscopes at embedded world, including the rackmount-optimized MXO 5C series, MXO 4, and MXO 5.
The R&S ScopeStudio, a novel solution that transfers MXO capability to a PC and facilitates the visualization, analysis, and sharing of oscilloscope results, is also available for visitors to try.
The incredibly quick MXO oscilloscopes assist design engineers in improving the dependability of their power electronics and other embedded systems when used in conjunction with corresponding high-quality active and passive probes.
For instance, the R&S RT-ZISO isolated probing system in conjunction with the eight-channel MXO 5 oscilloscope offers unmatched dynamic range, bandwidth, sensitivity, and accuracy, making it the preferred choice for characterizing, verifying, and debugging the next generation of wide-bandgap (WBG) power designs.
WBG materials like SiC and GaN increase power design efficiency, but a detailed description of the WBG semiconductor’s fast switching capabilities is necessary. In a different configuration, the MXO 5 oscilloscope will make it easier to validate the design of multi-phase buck converters and guarantee accurate outcomes.
Big data applications and others requiring lower voltages, larger currents, and quicker switching times can benefit from the operational advantages of high-speed multi-phase buck converter SoCs.
One important criterion for battery-powered devices is battery longevity. Using the R&S NGU source measuring device, visitors can observe in real time how GPS affects power consumption in a battery simulation scenario. Developers may measure current consumption during all stages and transitions from sleep to active mode with the help of a new analytic tool that helps them examine power consumption data obtained with the R&S NGU.
Debugging electromagnetic emissions and EMI compliance testing
Every electronic controller is susceptible to conducted or radiated electromagnetic emissions. Early debugging helps to isolate and correct EMI issue and accelerates time-to-market. As a leader in EMC testing, Rohde & Schwarz will present solutions that integrate EMI testing into the product design process.
Visitors can learn how to use the R&S RTO6 oscilloscope for EMI debugging or the R&S EPL1000 EMI test receiver for conducted EMI measurements.
The R&S EPL1000 delivers fast, accurate and reliable EMI pre-compliance and compliance measurements up to 30 MHz. It offers competitive pricing in the full CISPR 16-1-1 compliance receiver class for both device developers and conformance test houses.
Verifying signal integrity in high-speed digital designs
With rising data rates and integration densities creating new difficulties at the IC, board, and system levels, high speed digital interfaces are essential to electronic designs.
The Rohde & Schwarz booth at the trade show offers attendees information on robust tools for system verification, debugging, and compliance testing for PCBs, interconnects, and high-speed interfaces.
Using the R&S RTP164B oscilloscope, demonstrations will include robust verification and debugging tools for DDR5 system designs and Automotive Ethernet MGBase-T1 devices.
The new R&S ZNB3000 vector network analyzer will be introduced by Rohde & Schwarz at embedded world. This recently released vector network analyzer sets new benchmarks for speed, accuracy, and adaptability.
It is ideal for the most demanding applications, including data transfer and signal integrity applications, due to its industry-leading dynamic range, quick measurement speed, and scalable upgrades.
The instrument’s sophisticated de-embedding methods, which allow for accurate and effective S-parameter measurements, are available for visitors to experience. In a user-friendly way, these methods make it easier to characterize the test fixture, extract the S-parameters, and de-embed the test fixture.
Bluetooth and wireless connectivity testing
The industry standard for low-power, short-range wireless communications is Bluetooth®. Rohde & Schwarz provides a thorough, fully automated test solution authorized by the Bluetooth® SIG for confirming the physical layer operations of the recently released Bluetooth® Low Energy (LE) and Bluetooth® Classic through the CMW platform.
The new Bluetooth® Channel Sounding (CS) LE feature, which improves device placement based on very accurate distance measurements, will be validated by the R&S CMW270 wireless connectivity test platform, which is on exhibit at embedded world.
The next generation of WLAN technology, built for extremely high data throughput, will be more powerful, efficient, and sophisticated. The future-proof R&S CMP180 radio communication tester is suited to perform typical measurements on NR FR1, UWB, Wi-Fi 7 and early Wi-Fi 8 devices during R&D and production. Wi-Fi 8 and production-focused UWB measurements will be added to the non-signaling tester’s new features at embedded world.
These and other embedded industry-specific test solutions will be available at Rohde & Schwarz booth 4-218 in hall 4 during the embedded world exhibition & conference, which will take place in Nuremberg, Germany, from March 11–13, 2025.
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